Open-loop amplitude-modulation Kelvin probe force microscopy operated in single-pass PeakForce tapping mode

• Gheorghe Stan and
• Pradeep Namboodiri

Beilstein J. Nanotechnol. 2021, 12, 1115–1126, doi:10.3762/bjnano.12.83

• spatial resolution and measurement sensitivity of the AM-KPFM can be increased by deconvoluting the capacitive couplings. Corrections to the measured CPD values are based on multi-capacitances description [51], point spread function deconvolution [47][52][53], electrodynamic models [54], and numerical

A review of defect engineering, ion implantation, and nanofabrication using the helium ion microscope

• Frances I. Allen

Beilstein J. Nanotechnol. 2021, 12, 633–664, doi:10.3762/bjnano.12.52

• Winston et al. in Figure 5b [107]. Modeling and experimental measurements of the 2D point-spread function for HIBL (i.e., the spatial distribution of energy deposition, which determines the proximity effect) can be found in the same reference. Cai et al. extended this work to a 3D visualization of the

• point-spread function by performing point exposures on HSQ through a thin layer of silicon nitride and then developing the resist to remove non-exposed regions, leaving drop-shaped cross-linked structures that define the 3D exposed volumes [108] (Figure 5c). The authors also directly exposed substrate

The patterning toolbox FIB-o-mat: Exploiting the full potential of focused helium ions for nanofabrication

• Victor Deinhart,
• Lisa-Marie Kern,
• Jan N. Kirchhof,
• Sabrina Juergensen,
• Joris Sturm,
• Enno Krauss,
• Thorsten Feichtner,
• Sviatoslav Kovalchuk,
• Michael Schneider,
• Dieter Engel,
• Bastian Pfau,
• Bert Hecht,
• Kirill I. Bolotin,
• Stephanie Reich and
• Katja Höflich

Beilstein J. Nanotechnol. 2021, 12, 304–318, doi:10.3762/bjnano.12.25

• employing a point spread function that sums up all physical and chemical processes in resist activation [16]. All these methods have in common that the control over the actual beam path is limited. While there are attempts to reduce the amount of blanking operations [13] and to follow the geometry of the

Optically and electrically driven nanoantennas

• Monika Fleischer,
• Dai Zhang and
• Alfred J. Meixner

Beilstein J. Nanotechnol. 2020, 11, 1542–1545, doi:10.3762/bjnano.11.136

• confocal laser spot, and power-dependent modifications are observed in the resulting point-spread function profile. Last but not least, the electrically driven generation of photons is explored in [26] and [57]. In [26] the emission of light from electromigrated in-plane tunnel junctions is observed, where

Nonlinear absorption and scattering of a single plasmonic nanostructure characterized by x-scan technique

• Tushar C. Jagadale,
• Dhanya S. Murali and
• Shi-Wei Chu

Beilstein J. Nanotechnol. 2019, 10, 2182–2191, doi:10.3762/bjnano.10.211

• that the nonlinear response can be derived directly from the point spread function of the x-scan images. Exceptionally large nonlinearities of both scattering and absorption are unraveled simultaneously for the first time. The present study not only provides a novel method for characterizing

• scanning microscopy, where an excitation beam spot moves in the lateral x-direction across a single nanostructure. Similar to the requirements of z-scan, but converted into the x-direction, the diameter of the nanostructure should be much smaller than the point spread function (PSF) of the laser focus. At

Low cost tips for tip-enhanced Raman spectroscopy fabricated by two-step electrochemical etching of 125 µm diameter gold wires

• Antonino Foti,
• Francesco Barreca,
• Enza Fazio,
• Cristiano D’Andrea,
• Paolo Matteini,
• Onofrio Maria Maragò and
• Pietro Giuseppe Gucciardi

Beilstein J. Nanotechnol. 2018, 9, 2718–2729, doi:10.3762/bjnano.9.254

• intersection between the point spread function (PSF) of the objective (inclined by θinc = 60° with respect to the vertical) and the horizontal plane. Considering a = b = λ/2·NA and c = 2λ/NA2 the semi-axes of the PSF, we find SRaman = π·a·c’, where a’ = a ≈ 450 nm and ≈ 870 nm. Equation 5 provides meaningful

Fabrication of photothermally active poly(vinyl alcohol) films with gold nanostars for antibacterial applications

• Mykola Borzenkov,
• Maria Moros,
• Claudia Tortiglione,
• Serena Bertoldi,
• Nicola Contessi,
• Silvia Faré,
• Angelo Taglietti,
• Agnese D’Agostino,
• Piersandro Pallavicini,
• Maddalena Collini and
• Giuseppe Chirico

Beilstein J. Nanotechnol. 2018, 9, 2040–2048, doi:10.3762/bjnano.9.193

• point spread function of the microscope in reflection mode along the optical axis. We found that the number of spots identified was randomly dispersed around the average value irrespective of the distance from the film surface within 15%. Since the optical resolution is about 300 nm, we cannot ascertain

Photobleaching of YOYO-1 in super-resolution single DNA fluorescence imaging

• Joseph R. Pyle and
• Jixin Chen

Beilstein J. Nanotechnol. 2017, 8, 2296–2306, doi:10.3762/bjnano.8.229

• ) has great potential to visualize fine DNA structures with nanometer resolution. In a typical PAINT video acquisition, dye molecules (YOYO-1) in solution sparsely bind to the target surfaces (DNA) whose locations can be mathematically determined by fitting their fluorescent point spread function. Many

• per molecule during the imaging period. The theoretical square uncertainty of a super-resolved dye location using Gaussian fitting of the point spread function of a dye can be calculated with the Thompson equation [28][53]: where s is the standard deviation of the point spread function, a is the size

• power density of 23 W cm−2. In Figure 7, on average, s = 112 nm, a = 72 nm, and b = 120 counts. The total photocounts of a dye can be calculated by integrating the fitted volume under each point spread function (PSF) N = 2π APSF σx σy, where APSF is the PSF peak intensity in photocounts, and σx and σy

Ion beam profiling from the interaction with a freestanding 2D layer

• Ivan Shorubalko,
• Kyoungjun Choi,
• Michael Stiefel and
• Hyung Gyu Park

Beilstein J. Nanotechnol. 2017, 8, 682–687, doi:10.3762/bjnano.8.73

• resultant pore diameter. In return, the pore dimension as a function of the exposure dose brings out the ion beam profiles. Using this method of determining an ion-beam point spread function, we verify a Gaussian profile of focused gallium ion beams. Graphene sputtering yield is extracted from the

• source. Our method of profiling ion beams with 2D-layer perforation provides more information on ion beam profiles than the conventional sharp-edge scan method does. Keywords: exposure dose; focused ion beam; freestanding 2D layer; graphene; ion beam diameter; ion beam point spread function

• are exposed to ion beams, and in return this dependency reflects information of the ion beam profile. We determine a Ga-FIB point spread function and verify its Gaussian profile for different beam current values. The volume under the Gaussian profile is used to extract the graphene sputtering yield in

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

• Tino Wagner,
• Hannes Beyer,
• Patrick Reissner,
• Philipp Mensch,
• Heike Riel,
• Bernd Gotsmann and
• Andreas Stemmer

Beilstein J. Nanotechnol. 2015, 6, 2193–2206, doi:10.3762/bjnano.6.225

• changes of C'' is absent from the scan. Near the left electrode edge the measured Ulcpd displays less spatial variation because also the sides of the tip are in close proximity to the electrode edge, increasing their contribution to the tip–sample capacitance and widening the KFM point spread function

The effect of surface charge on nonspecific uptake and cytotoxicity of CdSe/ZnS core/shell quantum dots

• Vladimir V. Breus,
• Anna Pietuch,
• Marco Tarantola,
• Thomas Basché and
• Andreas Janshoff

Beilstein J. Nanotechnol. 2015, 6, 281–292, doi:10.3762/bjnano.6.26

• is approximate 600 nm in diameter (Supporting Information File 1, Figure S3). However, due to the point spread function of the microscope, we can assume that the actual size of the endosome is smaller. Accordingly, the observed vesicles might correspond to caveolae (d = 50–100 nm), rather than large

The role of the cantilever in Kelvin probe force microscopy measurements

• George Elias,
• Thilo Glatzel,
• Ernst Meyer,
• Alex Schwarzman,
• Amir Boag and
• Yossi Rosenwaks

Beilstein J. Nanotechnol. 2011, 2, 252–260, doi:10.3762/bjnano.2.29

• cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever. The calculations show that the cantilever has a very strong effect on the absolute value of the

• calculated and found to be relatively small. Keywords: boundary elements method; cantilever; convolution; Kelvin probe force microscopy; point spread function; Introduction The effect of the measuring probe in electrostatic force based microscopies, such as Kelvin probe force microscopy (KPFM) [1], is very

• cantilever in general, and in high resolution ultra-high vacuum (UHV) KPFM measurements in particular, has not been reported. In this work we use the boundary element method (BEM) [7] to calculate the point spread function (PSF) of the measuring probe: Tip and cantilever. The probe PSF analysis shows that